Based on the design of MPCP module, aiming at the issue that clock-gating register is difficult to control during the test, inserting control point before or after the clock-gating latch is used to solve the negative effect of clock gating. 针对插入门控寄存器造成测试很难控制这个问题,采取在锁存器的前后加入控制点的方法,解决了由于插入门控时钟而对可测性造成的影响。
To compensate the error originated from the non-ideal character of the SI circuits, some novel structures based on the technology of negative feedback, fully differential, class AB, SnI and other technologies to compensate the clock feed through effects are proposed and analyzed. 提出了应用负反馈技术、全差分技术、甲乙类技术、S~2I技术及钟馈效应消除技术的各种加强电路结构,用以补偿由开关电流电路非理想特性引起的各种误差。